PtSi-CONT

Platinum Silicide Probes Contact Mode

NANOSENSORS™ PtSi-CONT probes are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM) The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).
The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:

Platinum silicide coating with excellent conductivity and good wear-out behavior

High mechanical Q-factor for high sensitivity

Alignment grooves on backside of silicon holder chip

Cantilever Specifications
Spring k (N/m	0.2 (0.02 - 0.77)
Freq (kHz)	13 (6 - 21)
Length (µm)	450 (440 - 460)
Width (µm)	50 (42.5 - 57.5)
Thickness (µm)	2.0 (1.0 - 3.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	PtSi

Tip Specifications
Tip radius (nm)	25 +/- 5
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	PtSi