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PPP-XYNCHR

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Quick Overview

Silicon probe with XY-auto-alignment probes for non-contact /tapping mode application.

f = 330 kHz   |   k = 42 N/m   |   tip coating: none
Product Name Price Qty
PPP-XYNCHR (50 Pack)
(Ships in 1-2 Weeks)
€1,161.65
PPP-XYNCHR (20 Pack)
(Ships in 1-2 Weeks)
€494.00
PPP-XYNCHR (10 Pack)
(Ships in 1-2 Weeks)
€276.00

Details

PointProbe® Plus XY-alignment Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

The XY-auto-alignment probes for Non-Contact / Tapping mode application (High resonance frequency) with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 125 µm short cantilevers optimized for high speed non-contact / tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8 µm is possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.

The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)


    Cantilever Specifications
    Spring k (N/m 42 (10 - 130)
    Freq (kHz) 330 (204 - 497)
    Length (µm) 125 (115 - 135)
    Width (µm) 30 (22.5 - 37.5)
    Thickness (µm) 4.0 (3.0 - 5.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) Al (30)

    Tip Specifications
    Tip radius (nm) 7
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) none

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    Additional Information

    Tip Radius 7
    Tip Radius 5-10 nm
    Spring Constant 42
    Frequency 330
    Compatibility No
    Manufacturer Nanosensors

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