PPP-XYCONTR

PointProbe® Plus XY-alignment Contact Mode Reflex Coating

The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450 µm long cantilevers optimized for contact mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8 µm is possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.
As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

guaranteed tip radius of curvature < 10 nm

tip height 10 - 15 µm

highly doped silicon to dissipate static charge

Al coating on detector side of cantilever

chemically inert

high mechanical Q-factor for high sensitivity

tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)

Cantilever Specifications
Spring k (N/m	0.2 (0.02 - 0.77)
Freq (kHz)	13 (6 - 21)
Length (µm)	450 (440 - 460)
Width (µm)	50 (42.5 - 57.5)
Thickness (µm)	2.0 (1.0 - 3.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al (30)

Tip Specifications
Tip radius (nm)	7
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none