Details
PointProbe® Plus - High Quality-Factor - Non-Contact/ Tapping Mode - High Resonance Frequency - Reflex Coating
NANOSENSORS™ PPP-QNCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius (typical tip radius less than 7 nm) as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.
The probe offers unique features:
guaranteed tip radius of curvature < 10 nm
tip height 10 - 15 µm
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
chemically inert
excellent mechanical Q-factor under UHV conditions for high sensitivity
Cantilever Specifications
|
Spring k (N/m |
42 (10 - 130)
|
Freq (kHz) |
330 (204 - 497)
|
Length (µm) |
125 (115 - 135)
|
Width (µm) |
30 (22.5 - 37.5)
|
Thickness (µm) |
4.0 (3.0 - 5.0)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Al (30)
|
Tip Specifications
|
Tip radius (nm) |
7
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
25 +/- 2
|
Back angle (°) |
15 +/- 2
|
Side angle (°) |
22.5 +/- 2
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
none
|
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