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PPP-QFMR

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Quick Overview

High Q silicon probe with Al reflective coating for force modulation in vacuum.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
Product Name Price Qty
PPP-QFMR (10 Pack)
(Ships in 1-2 Weeks)
€552.00

Details

PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius (typical tip radius less than 7 nm) as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.



The probe offers unique features:
  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • excellent mechanical Q-factor under UHV conditions for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series


    Cantilever Specifications
    Spring k (N/m 2.8 (0.5 - 9.5)
    Freq (kHz) 75 (45 - 115)
    Length (µm) 225 (215 - 235)
    Width (µm) 28 (20 - 35)
    Thickness (µm) 3.0 (2.0 - 4.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) Al (30)

    Tip Specifications
    Tip radius (nm) 7
    Tip height (µm) 12.5 +/- 2.5
    Front angle (°) 25 +/- 2
    Back angle (°) 15 +/- 2
    Side angle (°) 22.5 +/- 2
    Tip shape 4-sided
    Tip material Silicon
    Tip coating (nm) none

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    Additional Information

    Tip Radius 7
    Tip Radius 5-10 nm
    Spring Constant 2.8
    Frequency 75
    Compatibility No
    Manufacturer Nanosensors

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