PPP-NCSTR

PointProbe® Plus Non-Contact / Soft Tapping Mode - Reflex Coating

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.

The probe offers unique features:

guaranteed tip radius of curvature < 10 nm

tip height 10 - 15 µm

highly doped silicon to dissipate static charge

Al coating on detector side of cantilever

chemically inert

high mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m	7.4 (1.2 - 29)
Freq (kHz)	160 (75 - 265)
Length (µm)	150 (140 - 160)
Width (µm)	27 (19.5 - 34.5)
Thickness (µm)	2.8 (1.8 - 3.8)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al (30)

Tip Specifications
Tip radius (nm)	7
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none