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Quick Overview

Silicon probe with no reflective coating for soft tapping mode.

f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none
Product Name Price Qty
PPP-NCST (50 Pack)
(Ships in 1-2 Weeks)
PPP-NCST (20 Pack)
(Ships in 1-2 Weeks)
PPP-NCST (10 Pack)
(Ships in 1-2 Weeks)


PointProbe® Plus Non-Contact / Soft Tapping Mode

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCST AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.

The probe offers unique features:
• Guaranteed tip radius of curvature < 10 nm
• Tip height 10 - 15 µm
• Highly doped silicon to dissipate static charge
• Chemically inert
• High mechanical Q-factor for high sensitivity

Cantilever Specifications
Spring k (N/m 7.4 (1.2 - 29)
Freq (kHz) 160 (75 - 265)
Length (µm) 150 (140 - 160)
Width (µm) 27 (19.5 - 34.5)
Thickness (µm) 2.8 (1.8 - 3.8)
Shape rectangular
Material Silicon
Reflex Coating (nm) none

Tip Specifications
Tip radius (nm) 7
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) none

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Additional Information

Tip Radius 7
Tip Radius 5-10 nm
Spring Constant 7.4
Frequency 160
Compatibility No
Manufacturer Nanosensors

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