0item(s)

You have no items in your shopping cart.

Product was successfully added to your shopping cart.

PPP-FMR

Be the first to review this product

Quick Overview

Silicon probe with Al reflective coating for force modulation.

f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none
Product Name Price Qty
PPP-FMR (50 Pack)
(Ships in 1-2 Weeks)
€1,161.65
PPP-FMR (20 Pack)
(Ships in 1-2 Weeks)
€494.00
PPP-FMR (10 Pack)
(Ships in 1-2 Weeks)
€276.00

Details

PointProbe® Plus Force Modulation Mode - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM probe serves also as a basis for magnetic coatings. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:
• Guaranteed tip radius of curvature < 10 nm
• Tip height 10 - 15 µm
• Highly doped silicon to dissipate static charge
• Al coating on detector side of cantilever
• High mechanical Q-factor for high sensitivity
• Alignment grooves on backside of silicon holder chip
• Precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
• Compatible with PointProbe® Plus XY-Alignment Series

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.


Cantilever Specifications
Spring k (N/m 2.8 (0.5 - 9.5)
Freq (kHz) 75 (45 - 115)
Length (µm) 225 (215 - 235)
Width (µm) 28 (20 - 35)
Thickness (µm) 3.0 (2.0 - 4.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Al (30)

Tip Specifications
Tip radius (nm) 7
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) none

Untitled Document

Additional Information

Tip Radius 7
Tip Radius 5-10 nm
Spring Constant 2.8
Frequency 75
Compatibility No
Manufacturer Nanosensors

Product Tags

Use spaces to separate tags. Use single quotes (') for phrases.

  1. Be the first to review this product

Write Your Own Review

Only registered users can write reviews. Please, log in or register