Details
PointProbe® Plus Contact Mode Short Cantilever - Reflex Coating
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features:
guaranteed tip radius of curvature < 10 nm
tip height 10 - 15 µm
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
high mechanical Q-factor for high sensitivity
alignment grooves on backside of silicon holder chip
precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series
Cantilever Specifications
|
Spring k (N/m |
0.2 (0.01 - 1.87)
|
Freq (kHz) |
23 (1 - 57)
|
Length (µm) |
225 (215 - 235)
|
Width (µm) |
48 (40 - 55)
|
Thickness (µm) |
1.0 (0.1 - 2.0)
|
Shape |
rectangular
|
Material |
Silicon
|
Reflex Coating (nm) |
Al (30)
|
Tip Specifications
|
Tip radius (nm) |
7
|
Tip height (µm) |
12.5 +/- 2.5
|
Front angle (°) |
25 +/- 2
|
Back angle (°) |
15 +/- 2
|
Side angle (°) |
22.5 +/- 2
|
Tip shape |
4-sided
|
Tip material |
Silicon
|
Tip coating (nm) |
none
|
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