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Details
PointProbe® Plus Contact Mode Short Cantilever - Reflex Coating
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features:
guaranteed tip radius of curvature < 10 nm
tip height 10 - 15 µm
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
high mechanical Q-factor for high sensitivity
alignment grooves on backside of silicon holder chip
precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features:
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 0.2 (0.01 - 1.87) |
| Freq (kHz) | 23 (1 - 57) |
| Length (µm) | 225 (215 - 235) |
| Width (µm) | 48 (40 - 55) |
| Thickness (µm) | 1.0 (0.1 - 2.0) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | Al (30) |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 7 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 25 +/- 2 |
| Back angle (°) | 15 +/- 2 |
| Side angle (°) | 22.5 +/- 2 |
| Tip shape | 4-sided |
| Tip material | Silicon |
| Tip coating (nm) | none |
Additional Information
| Tip Radius | 7 |
|---|---|
| Tip Radius | 5-10 nm |
| Spring Constant | 0.2 |
| Frequency | 23 |
| Compatibility | No |
| Manufacturer | Nanosensors |
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