NW-DT-FMR

Diamond coated Tip - Force Modulation Mode - Reflex Coating

The DT-FMR probe is designed for force modulation microscopy. The force constant of this cantilever type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM probe serves also as a basis for magnetic coatings. Furthermore non-contact or tapping mode operation is possible with the FM sensor but with reduced operation stability.
For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

The probe offers unique features:

real diamond coating

tip height 10 - 15 µm

high mechanical Q-factor for high sensitivity

alignment grooves on backside of silicon holder chip

precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip

compatible with PointProbe® Plus XY-Alignment Series

The DT Diamond Coating is an approximately 100 nm thick coating of polycrystalline diamond on the tip-side of the cantilever leading to an unsurpassed hardness of the tip. The raman spectrum of the coating verifies the real diamond.

Cantilever Specifications
Spring k (N/m	6.2 (3 - 11.4)
Freq (kHz)	105 (80 - 130)
Length (µm)	225 (215 - 235)
Width (µm)	28 (20 - 35)
Thickness (µm)	3.0 (2.0 - 4.0)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al (30)

Tip Specifications
Tip radius (nm)	150 +/- 50
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	diamond (100)