You have no items in your shopping cart.

Product was successfully added to your shopping cart.


Be the first to review this product

Quick Overview

Silicon probe with Al reflex coating for soft tapping mode.

f = 160 kHz   |   k = 7.4 N/m   |   tip coating: none
Product Name Price Qty
NCSTR (50 Pack)
(Ships in 1-2 Weeks)
NCSTR (20 Pack)
(Ships in 1-2 Weeks)
NCSTR (10 Pack)
(Ships in 1-2 Weeks)


Non-contact / Soft Tapping mode Reflex coating
NanoWorld Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this probe offers a typical tip radius of curvature of less than 8 nm.

Cantilever Specifications
Spring k (N/m 7.4 (3 - 16)
Freq (kHz) 160 (120 - 205)
Length (µm) 150 (145 - 150)
Width (µm) 27 (22 - 32)
Thickness (µm) 2.8 (2.3 - 3.3)
Shape rectangular
Material Silicon
Reflex Coating (nm) Al (30)

Tip Specifications
Tip radius (nm) 8 +/- 2
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) none

Untitled Document

Additional Information

Tip Radius 8
Tip Radius 5-10 nm
Spring Constant 7.4
Frequency 160
Compatibility blueDrive
Manufacturer Nanoworld

Product Tags

Use spaces to separate tags. Use single quotes (') for phrases.

  1. Be the first to review this product

Write Your Own Review

Only registered users can write reviews. Please, log in or register