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Details
Non-contact / Tapping™ mode - High resonance frequency - PtIr5
NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm.
NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
The tip radius of curvature is less than 25 nm.
| Cantilever Specifications | |
|---|---|
| Spring k (N/m | 42 (21 - 78) |
| Freq (kHz) | 320 (250 - 390) |
| Length (µm) | 125 (120 - 130) |
| Width (µm) | 30 (25 - 35) |
| Thickness (µm) | 4.0 (3.5 - 4.5) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | Cr/PtIr (5/25) |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 25 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 25 +/- 2 |
| Back angle (°) | 15 +/- 2 |
| Side angle (°) | 22.5 +/- 2 |
| Tip shape | 4-sided |
| Tip material | Silicon |
| Tip coating (nm) | Cr/PtIr (5/25) |
Additional Information
| Tip Radius | 25 |
|---|---|
| Tip Radius | > 20 nm |
| Spring Constant | 42 |
| Frequency | 320 |
| Compatibility | blueDrive |
| Manufacturer | Nanoworld |
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