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NCH

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Quick Overview

Silicon probe with no reflex coating for tapping/non-contact mode.

f = 320 kHz   |   k = 42 N/m   |   tip coating: none
Product Name Price Qty
NCH (50 Pack)
(Ships in 1-2 Weeks)
€1,100.00
NCH (20 Pack)
(Ships in 1-2 Weeks)
€463.00
NCH (10 Pack)
(Ships in 1-2 Weeks)
€259.00

Details

Non-contact / Tapping™ mode - High resonance frequency

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this probe offers typical tip radius of curvature of less than 8 nm.


Cantilever Specifications
Spring k (N/m 42 (21 - 78)
Freq (kHz) 320 (250 - 390)
Length (µm) 125 (120 - 130)
Width (µm) 30 (25 - 35)
Thickness (µm) 4.0 (3.5 - 4.5)
Shape rectangular
Material Silicon
Reflex Coating (nm) none

Tip Specifications
Tip radius (nm) 8 +/- 2
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) none

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Additional Information

Tip Radius 8
Tip Radius 5-10 nm
Spring Constant 42
Frequency 320
Compatibility No
Manufacturer Nanoworld

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