FMR

Quick Overview

Silicon probe with Al reflex coating for force modulation mode.

f = 75 kHz | k = 2.8 N/m | tip coating: none

Product Name	Price	Qty
FMR (50 Pack) (Ships in 1-2 Weeks)	€1,125.00
FMR (20 Pack) (Ships in 1-2 Weeks)	€510.00
FMR (10 Pack) (Ships in 1-2 Weeks)	€285.00

Details

Force Modulation Mode - Reflex coating
NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

Cantilever Specifications
Spring k (N/m	2.8 (1.2 - 5.5)
Freq (kHz)	75 (60 - 90)
Length (µm)	225 (220 - 230)
Width (µm)	28 (23 - 33)
Thickness (µm)	3.0 (2.5 - 3.5)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Al (30)

Tip Specifications
Tip radius (nm)	8 +/- 2
Tip height (µm)	12.5 +/- 2.5
Front angle (°)	25 +/- 2
Back angle (°)	15 +/- 2
Side angle (°)	22.5 +/- 2
Tip shape	4-sided
Tip material	Silicon
Tip coating (nm)	none