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CDT-CONTR

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Quick Overview

Silicon probe with conductive diamond coated tip for electrical measurements.

f = 20 kHz   |   k = 0.5 N/m   |   tip coating: conductive diamond

Product Name Price Qty
CDT-CONTR (50 Pack)
(Ships in 1-2 Weeks)
€5,040.00
CDT-CONTR (20 Pack)
(Ships in 1-2 Weeks)
€2,433.50
CDT-CONTR (10 Pack)
(Ships in 1-2 Weeks)
€1,277.00

Details

Conductive Diamond Coated Tip - Contact Mode - Reflex Coating

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.


Cantilever Specifications
Spring k (N/m 0.2 (0.02 - 0.77)
Freq (kHz) 13 (6 - 21)
Length (µm) 450 (440 - 460)
Width (µm) 50 (42.5 - 57.5)
Thickness (µm) 2.0 (1.0 - 3.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Al (30)

Tip Specifications
Tip radius (nm) 150 +/- 50
Tip height (µm) 12.5 +/- 2.5
Front angle (°) 25 +/- 2
Back angle (°) 15 +/- 2
Side angle (°) 22.5 +/- 2
Tip shape 4-sided
Tip material Silicon
Tip coating (nm) doped diamond (100)

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Additional Information

Tip Radius 150
Tip Radius > 20 nm
Spring Constant 0.5
Frequency 20
Compatibility blueDrive
Manufacturer Nanosensors

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