ATEC-NCPt

Advanced Tip at the End of the Cantilever™ Non-Contact/Tapping Mode, Pt/Ir coated

NANOSENSORS™ AdvancedTEC™ NCPt AFM tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation). Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features. The probe offers unique feature.

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:

real tip visibility from top

metallic conductivity of the tip

radius of curvature better than 20 nm

tip height 15 - 20 µm

high mechanical Q-factor for high sensitivity

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.

Cantilever Specifications
Spring k (N/m	45 (12 - 110)
Freq (kHz)	335 (210 - 490)
Length (µm)	160 (150 - 170)
Width (µm)	45 (40 - 50)
Thickness (µm)	4.6 (3.6 - 5.6)
Shape	rectangular
Material	Silicon
Reflex Coating (nm)	Cr/PtIr (5/25)

Tip Specifications
Tip radius (nm)	20
Tip height (µm)	17.5 +/- 2.5
Front angle (°)	-20 +/- 1
Back angle (°)	35 +/- 1
Side angle (°)	10 +/- 1
Tip shape	3-sided
Tip material	Silicon
Tip coating (nm)	Cr/PtIr (5/25)