0item(s)

You have no items in your shopping cart.

Product was successfully added to your shopping cart.

ATEC-FMAu

Be the first to review this product

Quick Overview

Conductive probe with tip visible at end of lever.

f = 85 kHz   |   k = 2.8 N/m   |   tip coating: Au
Product Name Price Qty
ATEC-FMAu (10 Pack)
(Ships in 1-2 Weeks)
€768.00

Details

Advanced Tip at the End of the Cantilever™Force Modulation Mode, Au coated

NANOSENSORS AdvancedTEC™ FMAu AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. The metallic coating is an approximately 70 nm thick double layer of chromium and gold on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts.


Cantilever Specifications
Spring k (N/m 2.8 (0.7 - 9.0)
Freq (kHz) 85 (50 - 130)
Length (µm) 240 (230 - 250)
Width (µm) 35 (30 - 40)
Thickness (µm) 3.0 (2.0 - 4.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Cr/Au (5/65)

Tip Specifications
Tip radius (nm) 63 +/- 13
Tip height (µm) 17.5 +/- 2.5
Front angle (°) -20 +/- 1
Back angle (°) 35 +/- 1
Side angle (°) 10 +/- 1
Tip shape 3-sided
Tip material Silicon
Tip coating (nm) Cr/Au (5/65)

Untitled Document

Additional Information

Tip Radius 63
Tip Radius > 20 nm
Spring Constant 2.8
Frequency 85
Compatibility blueDrive
Manufacturer Nanosensors

Product Tags

Use spaces to separate tags. Use single quotes (') for phrases.

  1. Be the first to review this product

Write Your Own Review

Only registered users can write reviews. Please, log in or register