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ATEC-FM

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Quick Overview

Silicon probe with tip visible at end of lever for force modulation.

f = 85 kHz   |   k = 2.8 N/m   |   tip coating: none
Product Name Price Qty
ATEC-FM (50 Pack)
(Ships in 1-2 Weeks)
€1,513.00
ATEC-FM (20 Pack)
(Ships in 1-2 Weeks)
€686.00
ATEC-FM (10 Pack)
(Ships in 1-2 Weeks)
€384.00

Details

Advanced Tip at the End of the Cantilever™ Force Modulation Mode

NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:
  • real tip visibility from top
  • typical tip radius of curvature better than 10 nm
  • tip height 15 - 20 µm
  • monolithic silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity


    Cantilever Specifications
    Spring k (N/m 2.8 (0.7 - 9.0)
    Freq (kHz) 85 (50 - 130)
    Length (µm) 240 (230 - 250)
    Width (µm) 35 (30 - 40)
    Thickness (µm) 3.0 (2.0 - 4.0)
    Shape rectangular
    Material Silicon
    Reflex Coating (nm) none

    Tip Specifications
    Tip radius (nm) 10
    Tip height (µm) 17.5 +/- 2.5
    Front angle (°) -20 +/- 1
    Back angle (°) 35 +/- 1
    Side angle (°) 10 +/- 1
    Tip shape 3-sided
    Tip material Silicon
    Tip coating (nm) none

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    Additional Information

    Tip Radius 10
    Tip Radius 5-10 nm
    Spring Constant 2.8
    Frequency 85
    Compatibility No
    Manufacturer Nanosensors

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