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ATEC-CONTAu

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Quick Overview

Conductive silicon probe with visible tip apex for contact mode electrical measurements.

f = 15 kHz   |   k = 0.2 N/m   |   tip coating: Au
Product Name Price Qty
ATEC-CONTAu (10 Pack)
(Ships in 1-2 Weeks)
€768.00

Details

Advanced Tip at the End of the Cantilever™ Contact Mode, Au coated

NANOSENSORS™ AdvancedTEC™ ContAu AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation). Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.


Cantilever Specifications
Spring k (N/m 0.2 (0.02 - 0.75)
Freq (kHz) 15 (7 - 25)
Length (µm) 450 (440 - 460)
Width (µm) 50 (45 - 55)
Thickness (µm) 2.0 (1.0 - 3.0)
Shape rectangular
Material Silicon
Reflex Coating (nm) Cr/Au (5/65)

Tip Specifications
Tip radius (nm) 63 +/- 13
Tip height (µm) 17.5 +/- 2.5
Front angle (°) -20 +/- 1
Back angle (°) 35 +/- 1
Side angle (°) 10 +/- 1
Tip shape 3-sided
Tip material Silicon
Tip coating (nm) Cr/Au (5/65)

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Additional Information

Tip Radius 63
Tip Radius > 20 nm
Spring Constant 0.2
Frequency 15
Compatibility No
Manufacturer Nanosensors

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