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Details
New and improved Oxford exclusive probe coated with high coercivity material for Magnetic Force Microscopy (MFM) measurements of challenging materials
Higher resolution and enhanced sensitivity are achievable using these probes. Applications include characterizing high-moment magnetic structures and excited magnetic devices which are not feasible using standard MFM probes. Other applications include investigation of samples under externally applied magnetic fields.
Probe with the highest coercivity in the market:>5000 Oe;
Tip and reflective coating: 30nm CoPt/FePt
Veeco equivalent: MESP-HC
Higher resolution and enhanced sensitivity are achievable using these probes. Applications include characterizing high-moment magnetic structures and excited magnetic devices which are not feasible using standard MFM probes. Other applications include investigation of samples under externally applied magnetic fields.
Probe with the highest coercivity in the market:>5000 Oe;
Tip and reflective coating: 30nm CoPt/FePt
Veeco equivalent: MESP-HC
| Cantilever Specifications | |
|---|---|
| Spring k (N/m) | 2.8 (1.4 - 5.8) |
| Freq (kHz) | 75 (58 - 97) |
| Length (µm) | 240 (235 - 245) |
| Width (µm) | 35 (30 - 40) |
| Thickness (µm) | 3 (2.5 - 3.5) |
| Shape | rectangular |
| Material | Silicon |
| Reflex Coating (nm) | CoPt/FePt (30) |
| Tip Specifications | |
|---|---|
| Tip radius (nm) | 32 +/- 7 |
| Tip height (µm) | 12.5 +/- 2.5 |
| Front angle (°) | 20 +/- 1 |
| Back angle (°) | 35 +/- 1 |
| Side angle (°) | 30 +/- 1 |
| Tip shape | 3-sided |
| Tip material | Silicon |
| Tip coating (nm) | CoPt/FePt (30) |
Additional Information
| Tip Radius | 32 |
|---|---|
| Tip Radius | > 20 nm |
| Spring Constant | 2 |
| Frequency | 70 |
| Compatibility | blueDrive |
| Manufacturer | Asylum Research |
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