Americas
North America
South America
Canada
Australia
Details
The 25Pt200B-H has a high frequency for use in non-contact and tapping mode AFM measurements, especially c-AFM and KPFM.
Material: Solid platinum probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy.
Specifications:
Tip shank length: 80 μm (± 25%)
Cantilever length: 200 μm (± 15%)
Cantilever width: 50 μm (± 15%)
Spring constant: 250 N/m (± 40%)
Frequency: 100 kHz (± 30%)
Tip radius: < 20 nm
⚹ 10 nm tip radius available (part number: 25Pt200B-H10)
Material: Solid platinum probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy.
Specifications:
Tip shank length: 80 μm (± 25%)
Cantilever length: 200 μm (± 15%)
Cantilever width: 50 μm (± 15%)
Spring constant: 250 N/m (± 40%)
Frequency: 100 kHz (± 30%)
Tip radius: < 20 nm
⚹ 10 nm tip radius available (part number: 25Pt200B-H10)
Additional Information
| Tip Radius | 20 |
|---|---|
| Tip Radius | 10-20 nm |
| Spring Constant | 250 |
| Frequency | 100 |
| Compatibility | No |
| Manufacturer | Rocky Mountain |
Related Products
Starting at: