12PT300B

The 12Pt300B has a higher spring constant than the 12Pt400B. It is typically used for contact AFM imaging, when a higher resonance frequency is desired.
Material: Solid platinum probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy.

Specifications:
Tip shank length: 80 μm (± 25%)
Cantilever length: 300 μm (± 15%)
Cantilever width: 60 μm (± 15%)
Spring constant: 0.8 N/m (± 40%)
Frequency: 9 kHz (± 30%)
Tip radius: < 20 nm